Metrology

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. Today, semiconductor manufacturing follows very strict standards and must accommodate very small dimensions. The resulting quality control (QC) procedures and semiconductor inspection processes have resulted in the development of high-precision semiconductor metrology instruments. Many of these devices and systems use a combination of laser, optical, and electron beam technologies. As a result, these semiconductor metrology instruments can help improve quality and output at every stage of production. By using semiconductor metrology instruments, manufacturers can facilitate semiconductor inspection, reduce manufacturing costs, and shorten the product development cycle.

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